Meeting the design challenges of nano-CMOS electronics

Publications

Papers

Journals

Capacitance variability of short range interconnects
Drysdale, T.D Brown, A.R Roy, S. Roy, G. Asenov, A.
Journal of Computational Electronics, December 2007.
download PDF 506KB

Conference and Workshops

Supporting Security-oriented Collaborative nanoCMOS Electronics e-Research
Sinnott,R.O. Millar,C. Stewart,G. Doherty,T. Martin,D. Watt,J. Procceedings of International Conference on Computational Science, Krakow, Poland, June 2008.
download PDF 1.21MB
Supporting Security-oriented, Collaborative nanoCMOS Electronics Research
Richard O. Sinnott, Thomas Doherty, David Martin, Campbell Millar, Gordon Stewart, John Watt
International Workshop on Computing Science (June 2008)
Advanced Security for Virtual Organizations: Exploring the Pros and Cons of Centralized vs Decentralized Security Models
Sinnott,R.O. Chadwick,D.W. Doherty,T. Martin,D. Stell,A.J. Stewart,G. Su,L. Watt,J. 8th IEEE International Symposium on Cluster Computing and the Grid (CCGrid 2008), May 2008, Lyon, France.
download PDF 265KB
Statistical Simulation of RTS Amplitude Distribution in Realistic Bulk MOSFETs Subject to Random Discreet Dopants
Muhammad Faiz. Bukhori, Scott Roy, Asen Asenov
Ultimate Limits of Integration in Silicon 2008. (12-14th March 2008)
Simulation of intrinsic parameter fluctuations in CMOS: the link between physical device and cirsuit
Binjie Chen, Scott Roy, Asen Asenov
Design Automation and Test in Europe: Workshop W2, Impact of Process Variability on Design and Test (10th -14th Mar 2008)
Statistical Circuit Simulation with the Effect of Random Discrete Dopants in Nanometer MOSFET Devices
Noor Ain Kamsani, Binjie Chen, Scott Roy, Asen Asenov
Design Automation and Test in Europe: Workshop W2, Impact of Process Variability on Design and Test. (10-14th Mar 2008)
Meeting the Design Challenges of Nano-CMOS Electronics
Campbell Millar, Scott Roy, David R.S Cumming, Tim D. Drysdale, Steve Furber, Doug Edwards, Mark Zwolinski, Andrew M Tyrrell, Alan Murray, Steven Pickles, Richard O Sinnott, David Berry, Asen Asenov
Workshop on the Impact of Process Variability on Design and Test. (Mar 2008)
Meeting the Design Challenges of Nano-CMOS Electronics
Campbell Millar, Scott Roy, David R.S Cumming, Tim D. Drysdale, Steve Furber, Doug Edwards, Mark Zwolinski, Andrew M Tyrrell, Alan Murray, Steven Pickles, Richard O Sinnott, David Berry, Asen Asenov
Design Automation and Test in Europe: Workshop W2, Imapct of Process Variability on Design and Test. (10th - 14th Mar 2008)
Supporting Statistical Semiconductor Device Analysis using EGEE and OMII-UK Middleware.
David Reid, Campbell Millar, Richard O. Sinnott, Scott Roy, Gareth Roy, Gordon Stewart, Graeme Stewart, Asen Asenov
2008
Impact of Device Variability on Design
Scott Roy, Campbell Millar, Asen Asenov
Ultimate Limits of Integration in Silicon 2008. (12th - 14th Mar 2008)
Statistical Compact Modelling as a Tool in Understanding Circuit Variability
Scott Roy, Campbell Millar, Asen Asenov
Design Automation and Test in Europe: Workshop W2, Impact of Process Variability on Design and Test. (10th - 14th Mar 2008)
Simulation of Strain Enhanced Variability in nMOSFETs
Xingsheng Wang, Binjie Cheng, Scott Roy, Asen Asenov
Ultimate Limits of Integration in Silicon 2008. (12th - 14th Mar 2008)
Towards a Grid-Enabled Simulation Framework for Nano-CMOS Electronics
Han,L. Sinnott,R.O. Stewart,G. Asenov,A. Roy,S. Roy,G. Millar,C. Berry,D.
Proceedings of IEEE e-Science 2007 Conference, Bangalore, India
download PDF 663KB
Interconnect Variability within Standard Cells
Timothy D Drysdale, Andrew R Brown,Gareth Roy, Scott Roy, Asen Asenov
12th International Workshop on Computational Electronics (8th - 10th Oct 2007)
Grid Infrastructures for the Electronics Domain: Requirements and Early Prototypes from an EPSRC Pilot Project
Sinnott,R.O. Stewart,G. Asenov,A. Millar,C. Roy,G. Roy,S. Brown,A.
"Best Paper Award" Proccedings of the UK e-Science All Hands Meeting, Nottingham, UK, September 2007.
download PDF 506KB
Meeting the Design Challenges of nano-CMOS Electronics
Asen Asenov, Campbell Millar, Scott Roy, David R.S. Cumming, Richard O Sinnott, Gordon Stewart, Alan F Murray, David Berry, Andrew M Tyrrell, James Hilder, Steve Furber, Stephen Pickles, M McKeown, Mark Zwolinski, David de Roure
Third International Nanotechnology Conference on Communication and Cooperation (16th-17th Apr 2007)
Meeting the Design Challenges of nanoCMOS Electronics: An Introduction to an EPSRC Pilot Project,
Sinnott,R.O. Asenov,A. Berry,D. Roy,S. Furber,S. Cummings,D. Tyrell,A. Murray,A. Zwolinski,M. Pickles,S. , Millar,C.
UK e-Science All Hands Meeting, Nottingham UK, September 2006.
download PDF 265KB

Meeting the design challenges of nano-CMOS Electronics

Publications

Papers

Posters

Presentations

	Meeting the design challenges of nano-CMOS Electronics UK consortium to use e-Science and Grid technology to tackle nano-CMOS design challenges
Menu Home People Publications Presentations Mailing Lists Partners Workshop Secure Site	You are here: Home » Publications Publications Papers Journals Capacitance variability of short range interconnects Drysdale, T.D Brown, A.R Roy, S. Roy, G. Asenov, A. Journal of Computational Electronics, December 2007. download PDF 506KB Conference and Workshops Supporting Security-oriented Collaborative nanoCMOS Electronics e-Research Sinnott,R.O. Millar,C. Stewart,G. Doherty,T. Martin,D. Watt,J. Procceedings of International Conference on Computational Science, Krakow, Poland, June 2008. download PDF 1.21MB Supporting Security-oriented, Collaborative nanoCMOS Electronics Research Richard O. Sinnott, Thomas Doherty, David Martin, Campbell Millar, Gordon Stewart, John Watt International Workshop on Computing Science (June 2008) Advanced Security for Virtual Organizations: Exploring the Pros and Cons of Centralized vs Decentralized Security Models Sinnott,R.O. Chadwick,D.W. Doherty,T. Martin,D. Stell,A.J. Stewart,G. Su,L. Watt,J. 8th IEEE International Symposium on Cluster Computing and the Grid (CCGrid 2008), May 2008, Lyon, France. download PDF 265KB Statistical Simulation of RTS Amplitude Distribution in Realistic Bulk MOSFETs Subject to Random Discreet Dopants Muhammad Faiz. Bukhori, Scott Roy, Asen Asenov Ultimate Limits of Integration in Silicon 2008. (12-14th March 2008) Simulation of intrinsic parameter fluctuations in CMOS: the link between physical device and cirsuit Binjie Chen, Scott Roy, Asen Asenov Design Automation and Test in Europe: Workshop W2, Impact of Process Variability on Design and Test (10th -14th Mar 2008) Statistical Circuit Simulation with the Effect of Random Discrete Dopants in Nanometer MOSFET Devices Noor Ain Kamsani, Binjie Chen, Scott Roy, Asen Asenov Design Automation and Test in Europe: Workshop W2, Impact of Process Variability on Design and Test. (10-14th Mar 2008) Meeting the Design Challenges of Nano-CMOS Electronics Campbell Millar, Scott Roy, David R.S Cumming, Tim D. Drysdale, Steve Furber, Doug Edwards, Mark Zwolinski, Andrew M Tyrrell, Alan Murray, Steven Pickles, Richard O Sinnott, David Berry, Asen Asenov Workshop on the Impact of Process Variability on Design and Test. (Mar 2008) Meeting the Design Challenges of Nano-CMOS Electronics Campbell Millar, Scott Roy, David R.S Cumming, Tim D. Drysdale, Steve Furber, Doug Edwards, Mark Zwolinski, Andrew M Tyrrell, Alan Murray, Steven Pickles, Richard O Sinnott, David Berry, Asen Asenov Design Automation and Test in Europe: Workshop W2, Imapct of Process Variability on Design and Test. (10th - 14th Mar 2008) Supporting Statistical Semiconductor Device Analysis using EGEE and OMII-UK Middleware. David Reid, Campbell Millar, Richard O. Sinnott, Scott Roy, Gareth Roy, Gordon Stewart, Graeme Stewart, Asen Asenov 2008 Impact of Device Variability on Design Scott Roy, Campbell Millar, Asen Asenov Ultimate Limits of Integration in Silicon 2008. (12th - 14th Mar 2008) Statistical Compact Modelling as a Tool in Understanding Circuit Variability Scott Roy, Campbell Millar, Asen Asenov Design Automation and Test in Europe: Workshop W2, Impact of Process Variability on Design and Test. (10th - 14th Mar 2008) Simulation of Strain Enhanced Variability in nMOSFETs Xingsheng Wang, Binjie Cheng, Scott Roy, Asen Asenov Ultimate Limits of Integration in Silicon 2008. (12th - 14th Mar 2008) Towards a Grid-Enabled Simulation Framework for Nano-CMOS Electronics Han,L. Sinnott,R.O. Stewart,G. Asenov,A. Roy,S. Roy,G. Millar,C. Berry,D. Proceedings of IEEE e-Science 2007 Conference, Bangalore, India download PDF 663KB Interconnect Variability within Standard Cells Timothy D Drysdale, Andrew R Brown,Gareth Roy, Scott Roy, Asen Asenov 12th International Workshop on Computational Electronics (8th - 10th Oct 2007) Grid Infrastructures for the Electronics Domain: Requirements and Early Prototypes from an EPSRC Pilot Project Sinnott,R.O. Stewart,G. Asenov,A. Millar,C. Roy,G. Roy,S. Brown,A. "Best Paper Award" Proccedings of the UK e-Science All Hands Meeting, Nottingham, UK, September 2007. download PDF 506KB Meeting the Design Challenges of nano-CMOS Electronics Asen Asenov, Campbell Millar, Scott Roy, David R.S. Cumming, Richard O Sinnott, Gordon Stewart, Alan F Murray, David Berry, Andrew M Tyrrell, James Hilder, Steve Furber, Stephen Pickles, M McKeown, Mark Zwolinski, David de Roure Third International Nanotechnology Conference on Communication and Cooperation (16th-17th Apr 2007) Meeting the Design Challenges of nanoCMOS Electronics: An Introduction to an EPSRC Pilot Project, Sinnott,R.O. Asenov,A. Berry,D. Roy,S. Furber,S. Cummings,D. Tyrell,A. Murray,A. Zwolinski,M. Pickles,S. , Millar,C. UK e-Science All Hands Meeting, Nottingham UK, September 2006. download PDF 265KB Posters Presentations