ESSDERC/ESSCIRC Workshop
cmos variability research in europe: from atomic scale to circuits and systems

Edinburgh International Conference Centre
19th September 2008

Abdelkarim Mercha


Abdelkarim Mercha received the M. Sc. in electrical engineering from the Ecole Nationale Supérieure d’Ingénieurs de Caen (ENSI de Caen) in 1997, and the Ph.D. in Physics on “Fluctuations in polycrystalline silicon thin film devices” from the University of Caen in December 2000. He joined IMEC in Belgium in 2001. His interests cover the field of device physics and Analog/RF characterization with particular emphasis on the study of mismatch and low-frequency noise in advanced devices. In these fields, he has (co-) authored over 150 Journal and Conference papers and 1 book chapter. He is also editor for Fluctuation and Noise Letters (FaN).
modeling summer school semiconductors Semiconductors semiconductor devices education training microelectronics industry medici TMA suprem workbench Synopsys Silvaco device modeling device simulation semiconductor simulation process simulation diffusion ion implantation impurities oxidation furnace finite element industrial services finite elements calibration design semiconductor research University of Glasgow electronics electrical engineering courses MOSFET CMOS transistor BJT diode doping doping profile electrons holes potential concentration fabrication silicon Si gallium arsenide GaAs silicon germanium III-V SiGe quantum mechanics transport band structures IWCE IEDM SISPAD ESSDERC density gradient taurus monte-carlo monte carlo thin body strained silicon CMOS SiNano device physics atomistic SOI greens functions green post doctoral academic glasgow tutorial summerschool simulation