ESSDERC/ESSCIRC Workshop
cmos variability research in europe: from atomic scale to circuits and systems
Edinburgh International Conference Centre
19th September 2008
19th September 2008
Hardware-software interactions in variability and reliability aware design
Scaling devices toward nanometer-scale dimensions is rapidly exacerbating reliability problems in large-scale integrated ICs. While power has emerged as the first major challenge for CMOS integration in the first decade of the XXI century, reliability his becoming the next key challenge. New materials, process improvements and device engineering will come to the rescue, but, as in the case of power, they are not sufficient. Hence, reliability is rapidly becoming a cross-cutting design challenge. Techniques and tools are required across the entire design flow, from circuits to software, as we must learn to build reliable systems with unreliable components. The talk will focus on circuit, architecture and computer-aided design techniques to address reliability concerns while keeping overhead under control.
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